Project title: PROCESS CONTROL TECHNOLOGIES

Company name : TEVET PROCESS CONTROL TECHNOLOGIES LTD.

TECHNOLOGIES LTD.

TECHNOLOGICAL FIELD
Microelectronics

KEY WORDS
Process Control,
Photoresist Thickness, Wafer, Microelectronics

PROJECT SUMMARY
Committed to provide superior solutions for advanced integrated
metrology, TEVET meets the challenges of the semiconductor
processing industry by setting new standards for improved process
control technologies.
Based on large spot size, broad band spectral reflectometry,
TEVET's measurement tools address the emerging need for in-situ
or integrated film thickness metrology offering robust, highly
accurate and affordable measurement solutions with seamless
integration to processing equipment.

TEVET's solutions enhance process quality, cost of ownership and
overall equipment effectiveness while offering the best ROI to
the end user.

ENTREPRENEUR
Mr. Ofer Du-Nour - M.S.c in Physics, Hebrew
University, Expert in the semiconductor field

PROJECT STATUS
The company has graduated from the incubator and successfully
raised several millions USD. The company has also initiated
significant sales to leading chip manufactures.

COOPERATION REQUIRED
Strategic partnership.
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POB 245 YOKNEAM MOSHAVA 20600 ISRAEL TEL: 972-4-9591775 FAX:
972-4-9591776 E-MAIL: Info@tevet-pct.com WEB: www.tevet-pct.com

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